Transformer Tester EE-2992

Transformer Tester EE-2992

The EE-2992 Transformer Tester is a professional-grade instrument for automated transformer testing including scanning, LCR measurements and DC bias options. Designed for precision and reliability, it offers wide measurement ranges, selectable test parameters and user-friendly interfaces for batch testing. The unit improves throughput while maintaining strict measurement accuracy required for advanced transformer production. Optional connectivity allows integration with factory automation systems.

Key Features

  • Advanced LCR/DCR testing capability
  • Automated scanning and batch testing
  • Wide measurement range and accuracy
  • Optional DC bias current source
  • High-speed test cycles
  • Graphical/LED display
  • Imported components for stability
  • Factory automation interfaces

Applications

  • Automated transformer QC
  • High-precision coil testing
  • Batch inspection and reporting
  • Power transformer validation
  • Lab and production testing
  • Integration with factory MES

Technical Specifications

MODEL EE-2992
Description 20-pin transformer scanning test + LCR test (optional). EE-2992 provides an extended function experience for LCR test. The experience/version mode may auto-disable after a preset duration. Contact sales or distributor for instrument serial details and full features.
BASIC ACCURACY (see operation manual)
LCRZ 0.05%
DCR, Turn Ratio 0.1%
Calibration / Warm-up Warm-up time > 30 minutes. Environment temperature: 23±5°C. Single voltage: 0.3 Vrms - 1 Vrms. Zeroing: after open or short. Length of test cable: 0 m (recommended).
FREQUENCY OF TEST SIGNAL
Range 20 Hz - 200 kHz
Resolution 0.5 mHz
Accuracy 0.01%
OUTPUT IMPEDANCE OF SIGNAL SOURCE
Selectable 10 Ω, 30 Ω, 50 Ω, 100 Ω (selectable), ±1% @ 1 kHz
LEVEL OF AC TEST SIGNAL
Normal Level 5 mV - 10 Vrms    (Min. resolution: 100 µV, Accuracy: 10% × set voltage + 2 mV)
50 µV - 100 mArms    (Min. resolution: 1 µA)
Constant Level 10 mV - 5 Vrms    (Min. resolution: 100 µV, Accuracy: 10% × set voltage + 2 mV)
100 µV - 50 mArms    (Min. resolution: 1 µA)
DC BIAS VOLTAGE SOURCE
Voltage 0 V – ±10 V    (Min. resolution: 0.5 mV, Accuracy: 1% × set voltage + 5 mV)
Current 0 mA – ±100 mA    (Min. resolution: 0.5 µA)
DC CONSTANT CURRENT SOURCE (Optional)
For diode P/N test (optional) 0 – ±120 mA    (Min. resolution: 0.5 µA, Accuracy: 1% × set voltage + 0.2 mA, Load open voltage < 5 V)
Optional (EE-2992) 0 – ±1 A    (Min. resolution: 0.5 mA, Accuracy: 1% × set voltage + 2 mA, Load open voltage < 9 V)
TRANSFORMER TEST PARAMETERS
Parameters Turn ratio, Turns, Phase, L, C, Lk, Q, ACR, DCR, Valance, Pin short, Diode P/N
LCR TEST PARAMETERS
Parameters |Z|, |Y|, C, L, X, B, R, G, D, Q, Θ, DCR, Turn-Ratio, Phase, Lk
DISPLAY RANGES
Display range of DCR 0.00001 Ω – 99.9999 MΩ
Display range of Turn Ratio 1 : 0.001 – 1000 : 1
IMPORTED MACHINE

Why Choose Double EE Electro Controls for Transformer Tester EE-2992?

Double EE Electro Controls offers superior precision, stable performance, and long-lasting reliability. Our Transformer Tester EE-2992 is engineered with quality components and supported by experienced after-sales service to ensure minimal downtime and optimal productivity.